Microwave testing of exfoliation in a dielectric plate
A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed me...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | A method of microwave non-destructive testing of exfoliation in a dielectric plate is developed. The proposed method is based on multi-frequency sensing in 5-mm waveband and solving of the inverse problem to determine dielectric structure's thickness. Precision and resolution of the proposed method are evaluated. |
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ISSN: | 2165-3585 2165-3593 |
DOI: | 10.1109/DIPED.2009.5307269 |