Breakdown voltage improvement of standard MOS technologies targeted at smart power

This paper presents and discusses trade-offs of three different design techniques intended to improve the breakdown voltage of n-type lateral medium power transistors to be fabricated in a conventional low cost CMOS technology. A thorough analysis of the static and dynamic characteristics of the mod...

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Bibliographische Detailangaben
Hauptverfasser: Mendonca Santos, P., Castro Simas, M.I., Lanca, M., Finco, S., Behrens, F.H.
Format: Tagungsbericht
Sprache:eng
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