Breakdown voltage improvement of standard MOS technologies targeted at smart power

This paper presents and discusses trade-offs of three different design techniques intended to improve the breakdown voltage of n-type lateral medium power transistors to be fabricated in a conventional low cost CMOS technology. A thorough analysis of the static and dynamic characteristics of the mod...

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Hauptverfasser: Mendonca Santos, P., Castro Simas, M.I., Lanca, M., Finco, S., Behrens, F.H.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:This paper presents and discusses trade-offs of three different design techniques intended to improve the breakdown voltage of n-type lateral medium power transistors to be fabricated in a conventional low cost CMOS technology. A thorough analysis of the static and dynamic characteristics of the modified structures was carried out with the support of a two-dimensional device simulator. The motivation behind this work was the construction of a low cost smart power microsystem, including control, sensing and protection circuitries, targeted at an electronic ballast for efficient control of the power delivered to fluorescent lamps.
ISSN:0197-2618
2576-702X
DOI:10.1109/IAS.1995.530401