Plug & play I/sub DDQ/ monitoring with QTAG

This paper describes the development of a language based on VHDL intended to simplify the use of I/sub DDQ//I/sub SSQ/ instrumentation in production IC testing. This language, called "Monitor Description Format" or MDF, is part of the development by QTAG (Quality Test Action Group) of an infrastructure for I/sub DDQ//I/sub SSQ/ testing. Using MDF developers and vendors of current monitors for test fixtures and test systems can define the functionality of the instrumentation. Using MDF the front-end tools to convert a test sequence to control the monitor can be automatically generated from the CAD test data for the DUT. In addition,for the test programs a standard library for control of monitors can be developed which would be driven from MDF. Ultimately MDF can be used with commercial supported QTAG monitors and ATE based measurement subsystems to create a "Plug and Play" environment for I/sub DDQ// I/sub SSQ/ testing.