A generic test and maintenance node for embedded system test

In order to build high performance embedded test systems, a Digital Test and Maintenance ASIC (DTMA) with embedded microprocessor, test bus port, and test network communication ports has been conceived. This DTMA "node" and 2 companion analog data acquisition devices form the basis of a st...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Lofgren, J.D.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Application specific integrated circuits Communication system control Control systems Costs Design for testability Embedded system Hardware Integrated circuit testing Production facilities System testing
Online-Zugang:	Volltext bestellen
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