IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | 999 |
| container_title | |
| container_volume | |
| creator | Bruce, W.C. Gallup, M.G. Giles, G. Munns, T. |
| description | |
| doi_str_mv | 10.1109/TEST.1992.527928 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_527928</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>527928</ieee_id><sourcerecordid>527928</sourcerecordid><originalsourceid>FETCH-LOGICAL-i89t-fcc9e46e764ad98157ae36986caec5e5f7681b44eeefdb3341f7d55c988e8e2a3</originalsourceid><addsrcrecordid>eNotj0tLw0AURgcfYKzdi6vsJXHuPO9dSog1kGRKkn2ZJjcQUZDGjf_eQv02Z3M48AnxCDIHkPQylP2QA5HKrfKk8EokSnvMlLLyWtxLj1JL76S_EQlIpExbTXdiu64f8jxjJRmXiOeq2ddlU7ZD1e5SAEM5pKFNiyb0aVMVXdh3oSj7PnT9g7id4-fK239uxPBWDsV7VoddVbzW2YL0k83jSGwce2fiRAjWR9aO0I2RR8t29g7haAwzz9NRawOzn6wdCZGRVdQb8XTJLmfl8H1avuLp93B5qf8AuVs_SQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Bruce, W.C. ; Gallup, M.G. ; Giles, G. ; Munns, T.</creator><creatorcontrib>Bruce, W.C. ; Gallup, M.G. ; Giles, G. ; Munns, T.</creatorcontrib><identifier>ISSN: 1089-3539</identifier><identifier>ISBN: 0780307607</identifier><identifier>ISBN: 9780780307605</identifier><identifier>EISSN: 2378-2250</identifier><identifier>DOI: 10.1109/TEST.1992.527928</identifier><language>eng</language><publisher>IEEE</publisher><subject>CMOS technology ; Design for testability ; Microprocessors ; Pins ; Production facilities ; Reduced instruction set computing ; Semiconductor devices ; Statistics ; Testing ; Very large scale integration</subject><ispartof>Proceedings International Test Conference 1992, 1992, p.999</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/527928$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/527928$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Bruce, W.C.</creatorcontrib><creatorcontrib>Gallup, M.G.</creatorcontrib><creatorcontrib>Giles, G.</creatorcontrib><creatorcontrib>Munns, T.</creatorcontrib><title>IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS</title><title>Proceedings International Test Conference 1992</title><addtitle>TEST</addtitle><subject>CMOS technology</subject><subject>Design for testability</subject><subject>Microprocessors</subject><subject>Pins</subject><subject>Production facilities</subject><subject>Reduced instruction set computing</subject><subject>Semiconductor devices</subject><subject>Statistics</subject><subject>Testing</subject><subject>Very large scale integration</subject><issn>1089-3539</issn><issn>2378-2250</issn><isbn>0780307607</isbn><isbn>9780780307605</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1992</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj0tLw0AURgcfYKzdi6vsJXHuPO9dSog1kGRKkn2ZJjcQUZDGjf_eQv02Z3M48AnxCDIHkPQylP2QA5HKrfKk8EokSnvMlLLyWtxLj1JL76S_EQlIpExbTXdiu64f8jxjJRmXiOeq2ddlU7ZD1e5SAEM5pKFNiyb0aVMVXdh3oSj7PnT9g7id4-fK239uxPBWDsV7VoddVbzW2YL0k83jSGwce2fiRAjWR9aO0I2RR8t29g7haAwzz9NRawOzn6wdCZGRVdQb8XTJLmfl8H1avuLp93B5qf8AuVs_SQ</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>Bruce, W.C.</creator><creator>Gallup, M.G.</creator><creator>Giles, G.</creator><creator>Munns, T.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1992</creationdate><title>IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS</title><author>Bruce, W.C. ; Gallup, M.G. ; Giles, G. ; Munns, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i89t-fcc9e46e764ad98157ae36986caec5e5f7681b44eeefdb3341f7d55c988e8e2a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1992</creationdate><topic>CMOS technology</topic><topic>Design for testability</topic><topic>Microprocessors</topic><topic>Pins</topic><topic>Production facilities</topic><topic>Reduced instruction set computing</topic><topic>Semiconductor devices</topic><topic>Statistics</topic><topic>Testing</topic><topic>Very large scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>Bruce, W.C.</creatorcontrib><creatorcontrib>Gallup, M.G.</creatorcontrib><creatorcontrib>Giles, G.</creatorcontrib><creatorcontrib>Munns, T.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bruce, W.C.</au><au>Gallup, M.G.</au><au>Giles, G.</au><au>Munns, T.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS</atitle><btitle>Proceedings International Test Conference 1992</btitle><stitle>TEST</stitle><date>1992</date><risdate>1992</risdate><spage>999</spage><pages>999-</pages><issn>1089-3539</issn><eissn>2378-2250</eissn><isbn>0780307607</isbn><isbn>9780780307605</isbn><pub>IEEE</pub><doi>10.1109/TEST.1992.527928</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1089-3539 |
| ispartof | Proceedings International Test Conference 1992, 1992, p.999 |
| issn | 1089-3539 2378-2250 |
| language | eng |
| recordid | cdi_ieee_primary_527928 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | CMOS technology Design for testability Microprocessors Pins Production facilities Reduced instruction set computing Semiconductor devices Statistics Testing Very large scale integration |
| title | IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T12%3A10%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=IMPLEMENTING%201149.1%20ON%20CMOS%20MICROPROCESSORS&rft.btitle=Proceedings%20International%20Test%20Conference%201992&rft.au=Bruce,%20W.C.&rft.date=1992&rft.spage=999&rft.pages=999-&rft.issn=1089-3539&rft.eissn=2378-2250&rft.isbn=0780307607&rft.isbn_list=9780780307605&rft_id=info:doi/10.1109/TEST.1992.527928&rft_dat=%3Cieee_6IE%3E527928%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=527928&rfr_iscdi=true |