A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand
This paper describes a novel filter rating method beyond the current 30-nm limit by combining dynamic light scattering and inductively coupled plasma mass spectrometer technique and proposes the use of gold nanoparticle as the standard challenge particle. Furthermore, the effect of protective ligand...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on semiconductor manufacturing 2009-11, Vol.22 (4), p.452-461 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 461 |
|---|---|
| container_issue | 4 |
| container_start_page | 452 |
| container_title | IEEE transactions on semiconductor manufacturing |
| container_volume | 22 |
| creator | Mizuno, T. Namiki, A. Tsuzuki, S. |
| description | This paper describes a novel filter rating method beyond the current 30-nm limit by combining dynamic light scattering and inductively coupled plasma mass spectrometer technique and proposes the use of gold nanoparticle as the standard challenge particle. Furthermore, the effect of protective ligand addition is investigated in order to decrease the adsorbing effect between gold nanoparticle and membrane surface. |
| doi_str_mv | 10.1109/TSM.2009.2031762 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_5235109</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5235109</ieee_id><sourcerecordid>875023917</sourcerecordid><originalsourceid>FETCH-LOGICAL-c418t-ec3dade193fc313502879c381ee8d7ec410e89555a1578ae23c0676af6ab58b3</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWD_ugpcgiKfVfGw2ybEUrUKrovXiJcTsrKZsNzXZFvz3prR48JIhmWeeCS9CZ5RcU0r0zex1es0I0fngVFZsDw2oEKpgvBT7aECULotKEHmIjlKaE0LLUssBeh_ix7CGFt_5toeIX2zvu088hf4r1PgtbS4TSAnPvmyHOSm6BR6HtsaPtgtLG3vvWsC2q_FzDD243q8BT_xnfjlBB41tE5zu6jGa3d3ORvfF5Gn8MBpOCldS1RfgeG1roJo3jlMuCFNSO64ogKolZIiA0kIIS4VUFhh3pJKVbSr7IdQHP0ZXW-0yhu8VpN4sfHLQtraDsEpGyazkmspMXvwj52EVu_w3oynLe1mlM0S2kIshpQiNWUa_sPHHUGI2SZuctNkkbXZJ55HLndcmZ9sm2s759DfHWDZLUWbufMt5APhrC8ZF1vJflMyEqg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912028269</pqid></control><display><type>article</type><title>A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand</title><source>IEEE Electronic Library (IEL)</source><creator>Mizuno, T. ; Namiki, A. ; Tsuzuki, S.</creator><creatorcontrib>Mizuno, T. ; Namiki, A. ; Tsuzuki, S.</creatorcontrib><description>This paper describes a novel filter rating method beyond the current 30-nm limit by combining dynamic light scattering and inductively coupled plasma mass spectrometer technique and proposes the use of gold nanoparticle as the standard challenge particle. Furthermore, the effect of protective ligand addition is investigated in order to decrease the adsorbing effect between gold nanoparticle and membrane surface.</description><identifier>ISSN: 0894-6507</identifier><identifier>EISSN: 1558-2345</identifier><identifier>DOI: 10.1109/TSM.2009.2031762</identifier><identifier>CODEN: ITSMED</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Biomembranes ; Counting circuits ; Electronics ; Electrons ; Exact sciences and technology ; Filters ; Fluorescence ; Gold ; Ligands ; Light scattering ; membranes ; metals ; Microelectronic fabrication (materials and surfaces technology) ; Nanocomposites ; Nanomaterials ; Nanoparticles ; Nanostructure ; Optical films ; particle measurements ; Protection ; Protective ; Ratings ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Semiconductors</subject><ispartof>IEEE transactions on semiconductor manufacturing, 2009-11, Vol.22 (4), p.452-461</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c418t-ec3dade193fc313502879c381ee8d7ec410e89555a1578ae23c0676af6ab58b3</citedby><cites>FETCH-LOGICAL-c418t-ec3dade193fc313502879c381ee8d7ec410e89555a1578ae23c0676af6ab58b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5235109$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,778,782,787,788,794,23917,23918,25127,27911,27912,54745</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5235109$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22282754$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Mizuno, T.</creatorcontrib><creatorcontrib>Namiki, A.</creatorcontrib><creatorcontrib>Tsuzuki, S.</creatorcontrib><title>A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand</title><title>IEEE transactions on semiconductor manufacturing</title><addtitle>TSM</addtitle><description>This paper describes a novel filter rating method beyond the current 30-nm limit by combining dynamic light scattering and inductively coupled plasma mass spectrometer technique and proposes the use of gold nanoparticle as the standard challenge particle. Furthermore, the effect of protective ligand addition is investigated in order to decrease the adsorbing effect between gold nanoparticle and membrane surface.</description><subject>Applied sciences</subject><subject>Biomembranes</subject><subject>Counting circuits</subject><subject>Electronics</subject><subject>Electrons</subject><subject>Exact sciences and technology</subject><subject>Filters</subject><subject>Fluorescence</subject><subject>Gold</subject><subject>Ligands</subject><subject>Light scattering</subject><subject>membranes</subject><subject>metals</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Nanocomposites</subject><subject>Nanomaterials</subject><subject>Nanoparticles</subject><subject>Nanostructure</subject><subject>Optical films</subject><subject>particle measurements</subject><subject>Protection</subject><subject>Protective</subject><subject>Ratings</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Semiconductors</subject><issn>0894-6507</issn><issn>1558-2345</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWD_ugpcgiKfVfGw2ybEUrUKrovXiJcTsrKZsNzXZFvz3prR48JIhmWeeCS9CZ5RcU0r0zex1es0I0fngVFZsDw2oEKpgvBT7aECULotKEHmIjlKaE0LLUssBeh_ix7CGFt_5toeIX2zvu088hf4r1PgtbS4TSAnPvmyHOSm6BR6HtsaPtgtLG3vvWsC2q_FzDD243q8BT_xnfjlBB41tE5zu6jGa3d3ORvfF5Gn8MBpOCldS1RfgeG1roJo3jlMuCFNSO64ogKolZIiA0kIIS4VUFhh3pJKVbSr7IdQHP0ZXW-0yhu8VpN4sfHLQtraDsEpGyazkmspMXvwj52EVu_w3oynLe1mlM0S2kIshpQiNWUa_sPHHUGI2SZuctNkkbXZJ55HLndcmZ9sm2s759DfHWDZLUWbufMt5APhrC8ZF1vJflMyEqg</recordid><startdate>20091101</startdate><enddate>20091101</enddate><creator>Mizuno, T.</creator><creator>Namiki, A.</creator><creator>Tsuzuki, S.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20091101</creationdate><title>A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand</title><author>Mizuno, T. ; Namiki, A. ; Tsuzuki, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c418t-ec3dade193fc313502879c381ee8d7ec410e89555a1578ae23c0676af6ab58b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Biomembranes</topic><topic>Counting circuits</topic><topic>Electronics</topic><topic>Electrons</topic><topic>Exact sciences and technology</topic><topic>Filters</topic><topic>Fluorescence</topic><topic>Gold</topic><topic>Ligands</topic><topic>Light scattering</topic><topic>membranes</topic><topic>metals</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Nanocomposites</topic><topic>Nanomaterials</topic><topic>Nanoparticles</topic><topic>Nanostructure</topic><topic>Optical films</topic><topic>particle measurements</topic><topic>Protection</topic><topic>Protective</topic><topic>Ratings</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Semiconductors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mizuno, T.</creatorcontrib><creatorcontrib>Namiki, A.</creatorcontrib><creatorcontrib>Tsuzuki, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on semiconductor manufacturing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mizuno, T.</au><au>Namiki, A.</au><au>Tsuzuki, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand</atitle><jtitle>IEEE transactions on semiconductor manufacturing</jtitle><stitle>TSM</stitle><date>2009-11-01</date><risdate>2009</risdate><volume>22</volume><issue>4</issue><spage>452</spage><epage>461</epage><pages>452-461</pages><issn>0894-6507</issn><eissn>1558-2345</eissn><coden>ITSMED</coden><abstract>This paper describes a novel filter rating method beyond the current 30-nm limit by combining dynamic light scattering and inductively coupled plasma mass spectrometer technique and proposes the use of gold nanoparticle as the standard challenge particle. Furthermore, the effect of protective ligand addition is investigated in order to decrease the adsorbing effect between gold nanoparticle and membrane surface.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TSM.2009.2031762</doi><tpages>10</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0894-6507 |
| ispartof | IEEE transactions on semiconductor manufacturing, 2009-11, Vol.22 (4), p.452-461 |
| issn | 0894-6507 1558-2345 |
| language | eng |
| recordid | cdi_ieee_primary_5235109 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Biomembranes Counting circuits Electronics Electrons Exact sciences and technology Filters Fluorescence Gold Ligands Light scattering membranes metals Microelectronic fabrication (materials and surfaces technology) Nanocomposites Nanomaterials Nanoparticles Nanostructure Optical films particle measurements Protection Protective Ratings Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Semiconductors |
| title | A Novel Filter Rating Method Using Less Than 30-nm Gold Nanoparticle and Protective Ligand |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T05%3A39%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Novel%20Filter%20Rating%20Method%20Using%20Less%20Than%2030-nm%20Gold%20Nanoparticle%20and%20Protective%20Ligand&rft.jtitle=IEEE%20transactions%20on%20semiconductor%20manufacturing&rft.au=Mizuno,%20T.&rft.date=2009-11-01&rft.volume=22&rft.issue=4&rft.spage=452&rft.epage=461&rft.pages=452-461&rft.issn=0894-6507&rft.eissn=1558-2345&rft.coden=ITSMED&rft_id=info:doi/10.1109/TSM.2009.2031762&rft_dat=%3Cproquest_RIE%3E875023917%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912028269&rft_id=info:pmid/&rft_ieee_id=5235109&rfr_iscdi=true |