Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

A full-flow failure analysis (FA) was introduced in this paper. From the FA, we resolved odd/ even word-line failure which lead to poor endurance performance of a NAND Flash. After removing this defect, the endurance performance of this NAND Flash is greatly enhanced.

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Bibliographische Detailangaben
Hauptverfasser: Young Sun, Zhang, M., Jossen Yu, Dong, W., Chien, W.-T.K.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Failure analysis
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Beschreibung
Zusammenfassung:A full-flow failure analysis (FA) was introduced in this paper. From the FA, we resolved odd/ even word-line failure which lead to poor endurance performance of a NAND Flash. After removing this defect, the endurance performance of this NAND Flash is greatly enhanced.
ISSN:1946-1542
1946-1550
DOI:10.1109/IPFA.2009.5232715