$Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation$

Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation

XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

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Bibliographische Detailangaben
Hauptverfasser:	Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Chapman, R.T., Butcher, T.J., Brocklesby, W.S., Frey, J.G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	(290.4020) Mie Theory (340.7480) X-rays Dielectric constant Dielectric measurements Diffraction Extraterrestrial measurements Extreme Ultraviolet Frequency conversion Mirrors Optical pulse generation Refractive index Scanning electron microscopy Soft X-rays X-rays
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