Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation
XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres. |
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ISSN: | 2160-9004 |
DOI: | 10.1364/CLEO.2009.CFN6 |