Compendium of TID and SEL test results for various candidate spacecraft electronics

We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event latch up. Most of the tested devices are commercial integrated circuits, including Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), Ampl...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Malou, F., Dangla, D., Bezerra, F., Garnier, J., Sifflet, S., Falo, W., Pascal, J.-F.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Aerospace electronics Analog integrated circuits Analog-digital conversion Circuit testing Digital integrated circuits Digital-analog conversion Electronic equipment testing Integrated circuit testing Latches Space vehicles
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event latch up. Most of the tested devices are commercial integrated circuits, including Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), Amplifiers, Power management products and others.
ISSN:	0379-6566
DOI:	10.1109/RADECS.2007.5205560