Effects of photoinduced carrier injection on timedependent dielectric breakdown

Time-dependent dielectric breakdown experiments were performed under broadband UV illumination in order to investigate the effects of increased electron concentration on time to breakdown. Preliminary results show that breakdown can be achieved at shorter time scales and lower fields than in standar...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Atkin, J.M., Laibowitz, R.B., Heinz, T.F., Lloyd, J.R., Shaw, T.M., Cartier, E.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	breakdown Dielectric breakdown Dielectric materials Electric breakdown Electrodes Electrons Life estimation low-k Materials reliability Metal-insulator structures Physics reliability Testing
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