Characterization of electron surface scattering in single crystalline metallic nanowires

The research presented in this paper is on the modeling and characterization of electrical resistivity for single crystalline silver nanowires. Silver nanowires were self-assembled on vicinal silicon in a high-vacuum environment with high purity metal sources. These wires are atomically smooth and h...

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Hauptverfasser: Qiaojian Huang, Lilley, C.M., Bode, M.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:The research presented in this paper is on the modeling and characterization of electrical resistivity for single crystalline silver nanowires. Silver nanowires were self-assembled on vicinal silicon in a high-vacuum environment with high purity metal sources. These wires are atomically smooth and have little to no contaminants. Current-voltage curves were measured in direct contact using a four-point probe measurement within the high vacuum environment.
DOI:10.1109/NMDC.2009.5167569