Approach for developing a large signal model of a 150 GHz HEMT
In this contribution the development of a large signal model describing the electrical behaviour of an InAlAs/InGaAs/InP-HEMT will be discussed. The transistors under question were fabricated at our laboratory. They revealed a transit frequency of 150 GHz, which is, to our knowledge, the best result...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 137 |
---|---|
container_issue | |
container_start_page | 133 |
container_title | |
container_volume | |
creator | Diskus, C.G. Bergamaschi, C. Schefer, M. Patrick, W. Klepser, B.-U.H. Baechtold, W. |
description | In this contribution the development of a large signal model describing the electrical behaviour of an InAlAs/InGaAs/InP-HEMT will be discussed. The transistors under question were fabricated at our laboratory. They revealed a transit frequency of 150 GHz, which is, to our knowledge, the best result obtained with a T-gate of 0.25 /spl mu/m footprint. The aim of this project was to develop a model of this transistor for simulating nonlinear circuits with commercial simulator software like HP-MDS or Spice. The procedure results in an easily applicable model which produces very good fits to the measured S-parameters. |
doi_str_mv | 10.1109/INMMC.1994.512518 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_512518</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>512518</ieee_id><sourcerecordid>512518</sourcerecordid><originalsourceid>FETCH-LOGICAL-i118t-d92e14c11738cdc7764be11d1060898b9e63bac278ce05ea89f014a068606dd43</originalsourceid><addsrcrecordid>eNotj1FLwzAUhQMqOGZ_gD7lD7Tem6Rp8iKMMtfBqi_zeaTJbQ10a2lF0F9vYcKBA9_D4TuMPSJkiGCf9291XWZorcpyFDmaG5bYwsASKRRYvGUrsNKkBoS5Z8k8xwYQdKEE6BV72YzjNDj_ydth4oG-qR_GeOm4472bOuJz7C6u5-chUM-HduGYA99Vv7za1scHdte6fqbkv9fs43V7LKv08L7bl5tDGhHNVxqsIFQesZDGB18UWjWEGBYPMNY0lrRsnBeF8QQ5OWNbQOVAGw06BCXX7Om6G4noNE7x7Kaf0_Ww_ANwCUbE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Approach for developing a large signal model of a 150 GHz HEMT</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Diskus, C.G. ; Bergamaschi, C. ; Schefer, M. ; Patrick, W. ; Klepser, B.-U.H. ; Baechtold, W.</creator><creatorcontrib>Diskus, C.G. ; Bergamaschi, C. ; Schefer, M. ; Patrick, W. ; Klepser, B.-U.H. ; Baechtold, W.</creatorcontrib><description>In this contribution the development of a large signal model describing the electrical behaviour of an InAlAs/InGaAs/InP-HEMT will be discussed. The transistors under question were fabricated at our laboratory. They revealed a transit frequency of 150 GHz, which is, to our knowledge, the best result obtained with a T-gate of 0.25 /spl mu/m footprint. The aim of this project was to develop a model of this transistor for simulating nonlinear circuits with commercial simulator software like HP-MDS or Spice. The procedure results in an easily applicable model which produces very good fits to the measured S-parameters.</description><identifier>ISSN: 0938-8028</identifier><identifier>ISBN: 9780780324091</identifier><identifier>ISBN: 0780324099</identifier><identifier>DOI: 10.1109/INMMC.1994.512518</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit simulation ; Circuit testing ; Electrical resistance measurement ; Electromagnetic fields ; HEMTs ; Laboratories ; Predictive models ; Scattering parameters ; Solid modeling ; Voltage</subject><ispartof>Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits, 1994, p.133-137</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/512518$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/512518$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Diskus, C.G.</creatorcontrib><creatorcontrib>Bergamaschi, C.</creatorcontrib><creatorcontrib>Schefer, M.</creatorcontrib><creatorcontrib>Patrick, W.</creatorcontrib><creatorcontrib>Klepser, B.-U.H.</creatorcontrib><creatorcontrib>Baechtold, W.</creatorcontrib><title>Approach for developing a large signal model of a 150 GHz HEMT</title><title>Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits</title><addtitle>INMMC</addtitle><description>In this contribution the development of a large signal model describing the electrical behaviour of an InAlAs/InGaAs/InP-HEMT will be discussed. The transistors under question were fabricated at our laboratory. They revealed a transit frequency of 150 GHz, which is, to our knowledge, the best result obtained with a T-gate of 0.25 /spl mu/m footprint. The aim of this project was to develop a model of this transistor for simulating nonlinear circuits with commercial simulator software like HP-MDS or Spice. The procedure results in an easily applicable model which produces very good fits to the measured S-parameters.</description><subject>Circuit simulation</subject><subject>Circuit testing</subject><subject>Electrical resistance measurement</subject><subject>Electromagnetic fields</subject><subject>HEMTs</subject><subject>Laboratories</subject><subject>Predictive models</subject><subject>Scattering parameters</subject><subject>Solid modeling</subject><subject>Voltage</subject><issn>0938-8028</issn><isbn>9780780324091</isbn><isbn>0780324099</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1994</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj1FLwzAUhQMqOGZ_gD7lD7Tem6Rp8iKMMtfBqi_zeaTJbQ10a2lF0F9vYcKBA9_D4TuMPSJkiGCf9291XWZorcpyFDmaG5bYwsASKRRYvGUrsNKkBoS5Z8k8xwYQdKEE6BV72YzjNDj_ydth4oG-qR_GeOm4472bOuJz7C6u5-chUM-HduGYA99Vv7za1scHdte6fqbkv9fs43V7LKv08L7bl5tDGhHNVxqsIFQesZDGB18UWjWEGBYPMNY0lrRsnBeF8QQ5OWNbQOVAGw06BCXX7Om6G4noNE7x7Kaf0_Ww_ANwCUbE</recordid><startdate>1994</startdate><enddate>1994</enddate><creator>Diskus, C.G.</creator><creator>Bergamaschi, C.</creator><creator>Schefer, M.</creator><creator>Patrick, W.</creator><creator>Klepser, B.-U.H.</creator><creator>Baechtold, W.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1994</creationdate><title>Approach for developing a large signal model of a 150 GHz HEMT</title><author>Diskus, C.G. ; Bergamaschi, C. ; Schefer, M. ; Patrick, W. ; Klepser, B.-U.H. ; Baechtold, W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i118t-d92e14c11738cdc7764be11d1060898b9e63bac278ce05ea89f014a068606dd43</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Circuit simulation</topic><topic>Circuit testing</topic><topic>Electrical resistance measurement</topic><topic>Electromagnetic fields</topic><topic>HEMTs</topic><topic>Laboratories</topic><topic>Predictive models</topic><topic>Scattering parameters</topic><topic>Solid modeling</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Diskus, C.G.</creatorcontrib><creatorcontrib>Bergamaschi, C.</creatorcontrib><creatorcontrib>Schefer, M.</creatorcontrib><creatorcontrib>Patrick, W.</creatorcontrib><creatorcontrib>Klepser, B.-U.H.</creatorcontrib><creatorcontrib>Baechtold, W.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Diskus, C.G.</au><au>Bergamaschi, C.</au><au>Schefer, M.</au><au>Patrick, W.</au><au>Klepser, B.-U.H.</au><au>Baechtold, W.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Approach for developing a large signal model of a 150 GHz HEMT</atitle><btitle>Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits</btitle><stitle>INMMC</stitle><date>1994</date><risdate>1994</risdate><spage>133</spage><epage>137</epage><pages>133-137</pages><issn>0938-8028</issn><isbn>9780780324091</isbn><isbn>0780324099</isbn><abstract>In this contribution the development of a large signal model describing the electrical behaviour of an InAlAs/InGaAs/InP-HEMT will be discussed. The transistors under question were fabricated at our laboratory. They revealed a transit frequency of 150 GHz, which is, to our knowledge, the best result obtained with a T-gate of 0.25 /spl mu/m footprint. The aim of this project was to develop a model of this transistor for simulating nonlinear circuits with commercial simulator software like HP-MDS or Spice. The procedure results in an easily applicable model which produces very good fits to the measured S-parameters.</abstract><pub>IEEE</pub><doi>10.1109/INMMC.1994.512518</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0938-8028 |
ispartof | Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits, 1994, p.133-137 |
issn | 0938-8028 |
language | eng |
recordid | cdi_ieee_primary_512518 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit simulation Circuit testing Electrical resistance measurement Electromagnetic fields HEMTs Laboratories Predictive models Scattering parameters Solid modeling Voltage |
title | Approach for developing a large signal model of a 150 GHz HEMT |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T14%3A30%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Approach%20for%20developing%20a%20large%20signal%20model%20of%20a%20150%20GHz%20HEMT&rft.btitle=Third%20International%20Workshop%20on%20Integrated%20Nonlinear%20Microwave%20and%20Millimeterwave%20Circuits&rft.au=Diskus,%20C.G.&rft.date=1994&rft.spage=133&rft.epage=137&rft.pages=133-137&rft.issn=0938-8028&rft.isbn=9780780324091&rft.isbn_list=0780324099&rft_id=info:doi/10.1109/INMMC.1994.512518&rft_dat=%3Cieee_6IE%3E512518%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=512518&rfr_iscdi=true |