High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS
In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 M...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2408 |
|---|---|
| container_issue | |
| container_start_page | 2405 |
| container_title | |
| container_volume | |
| creator | Emira, A. Carr, F. Elwan, H. Mekky, R.H. |
| description | In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm 2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm 2 . Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output. |
| doi_str_mv | 10.1109/ISCAS.2009.5118285 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5118285</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5118285</ieee_id><sourcerecordid>5118285</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-7ab276e1e864292ca557d083c352961cdb39bdb6493f3db21be27cb09be4aa283</originalsourceid><addsrcrecordid>eNpFkM1Kw0AUhcefgmn1BXQzL5A4985PZpY1VFuodFF1W2aS2xhNU0nHgm9vwIKrw-GDj8Nh7BZEBiDc_WJdTNcZCuEyDWDR6jM2BoVKyaGoc5YgaJuCRn3xD3JzyRKBOaRKChyxxIrUKKOluGLjw-FDiMFoMGHTeVO_8-O-jb4mHvct9b6LvOki1b2PVPGH7_KTl_vuSH2kfiDc6G7HMdNvvHhera_ZaOvbA92ccsJeH2cvxTxdrp4WxXSZNpDrmOY-DKsIyBqFDkuvdV4JK0up0RkoqyBdqIJRTm5lFRACYV4G4QIp79HKCbv78zZEtPnqm53vfzanT-QveaZNqQ</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Emira, A. ; Carr, F. ; Elwan, H. ; Mekky, R.H.</creator><creatorcontrib>Emira, A. ; Carr, F. ; Elwan, H. ; Mekky, R.H.</creatorcontrib><description>In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm 2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm 2 . Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output.</description><identifier>ISSN: 0271-4302</identifier><identifier>ISBN: 1424438276</identifier><identifier>ISBN: 9781424438273</identifier><identifier>EISSN: 2158-1525</identifier><identifier>EISBN: 1424438284</identifier><identifier>EISBN: 9781424438280</identifier><identifier>DOI: 10.1109/ISCAS.2009.5118285</identifier><identifier>LCCN: 80-646530</identifier><language>eng</language><publisher>IEEE</publisher><subject>Breakdown voltage ; Buck converters ; CMOS technology ; DC-DC power converters ; Inductors ; Protection ; Regulators ; Switches ; Switching frequency ; Voltage control</subject><ispartof>2009 IEEE International Symposium on Circuits and Systems (ISCAS), 2009, p.2405-2408</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5118285$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5118285$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Emira, A.</creatorcontrib><creatorcontrib>Carr, F.</creatorcontrib><creatorcontrib>Elwan, H.</creatorcontrib><creatorcontrib>Mekky, R.H.</creatorcontrib><title>High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS</title><title>2009 IEEE International Symposium on Circuits and Systems (ISCAS)</title><addtitle>ISCAS</addtitle><description>In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm 2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm 2 . Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output.</description><subject>Breakdown voltage</subject><subject>Buck converters</subject><subject>CMOS technology</subject><subject>DC-DC power converters</subject><subject>Inductors</subject><subject>Protection</subject><subject>Regulators</subject><subject>Switches</subject><subject>Switching frequency</subject><subject>Voltage control</subject><issn>0271-4302</issn><issn>2158-1525</issn><isbn>1424438276</isbn><isbn>9781424438273</isbn><isbn>1424438284</isbn><isbn>9781424438280</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkM1Kw0AUhcefgmn1BXQzL5A4985PZpY1VFuodFF1W2aS2xhNU0nHgm9vwIKrw-GDj8Nh7BZEBiDc_WJdTNcZCuEyDWDR6jM2BoVKyaGoc5YgaJuCRn3xD3JzyRKBOaRKChyxxIrUKKOluGLjw-FDiMFoMGHTeVO_8-O-jb4mHvct9b6LvOki1b2PVPGH7_KTl_vuSH2kfiDc6G7HMdNvvHhera_ZaOvbA92ccsJeH2cvxTxdrp4WxXSZNpDrmOY-DKsIyBqFDkuvdV4JK0up0RkoqyBdqIJRTm5lFRACYV4G4QIp79HKCbv78zZEtPnqm53vfzanT-QveaZNqQ</recordid><startdate>200905</startdate><enddate>200905</enddate><creator>Emira, A.</creator><creator>Carr, F.</creator><creator>Elwan, H.</creator><creator>Mekky, R.H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200905</creationdate><title>High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS</title><author>Emira, A. ; Carr, F. ; Elwan, H. ; Mekky, R.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-7ab276e1e864292ca557d083c352961cdb39bdb6493f3db21be27cb09be4aa283</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Breakdown voltage</topic><topic>Buck converters</topic><topic>CMOS technology</topic><topic>DC-DC power converters</topic><topic>Inductors</topic><topic>Protection</topic><topic>Regulators</topic><topic>Switches</topic><topic>Switching frequency</topic><topic>Voltage control</topic><toplevel>online_resources</toplevel><creatorcontrib>Emira, A.</creatorcontrib><creatorcontrib>Carr, F.</creatorcontrib><creatorcontrib>Elwan, H.</creatorcontrib><creatorcontrib>Mekky, R.H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Emira, A.</au><au>Carr, F.</au><au>Elwan, H.</au><au>Mekky, R.H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS</atitle><btitle>2009 IEEE International Symposium on Circuits and Systems (ISCAS)</btitle><stitle>ISCAS</stitle><date>2009-05</date><risdate>2009</risdate><spage>2405</spage><epage>2408</epage><pages>2405-2408</pages><issn>0271-4302</issn><eissn>2158-1525</eissn><isbn>1424438276</isbn><isbn>9781424438273</isbn><eisbn>1424438284</eisbn><eisbn>9781424438280</eisbn><abstract>In this paper, an integrated DC-DC (Buck) converter is presented. The Buck converter accepts input voltage in the range 2.7-5.5 V while using 2.5 V devices. A low drop-out (LDO) regulator is used to limit the maximum input voltage to the DCDC switches to protect it against overvoltage breakdown. 5 MHz switching frequency is used to allow using smaller external inductors. The Buck converter is implemented in TSMC 65 nm CMOS technology and it occupies 0.15 mm 2 while the LDO regulator, bandgap, clock generator and bias circuits occupy 0.19 mm 2 . Up to 88% and 77% efficiency is achieved at 2.5 V and 1.2 V output, respectively, using 3.6 V input. If the input voltage is limited to 3.3 V, the LDO regulator is bypassed, and the peak efficiency becomes 92% for 2.5 V and 85% for 1.2 V output.</abstract><pub>IEEE</pub><doi>10.1109/ISCAS.2009.5118285</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0271-4302 |
| ispartof | 2009 IEEE International Symposium on Circuits and Systems (ISCAS), 2009, p.2405-2408 |
| issn | 0271-4302 2158-1525 |
| language | eng |
| recordid | cdi_ieee_primary_5118285 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Breakdown voltage Buck converters CMOS technology DC-DC power converters Inductors Protection Regulators Switches Switching frequency Voltage control |
| title | High voltage tolerant integrated Buck converter in 65nm 2.5V CMOS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T05%3A48%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=High%20voltage%20tolerant%20integrated%20Buck%20converter%20in%2065nm%202.5V%20CMOS&rft.btitle=2009%20IEEE%20International%20Symposium%20on%20Circuits%20and%20Systems%20(ISCAS)&rft.au=Emira,%20A.&rft.date=2009-05&rft.spage=2405&rft.epage=2408&rft.pages=2405-2408&rft.issn=0271-4302&rft.eissn=2158-1525&rft.isbn=1424438276&rft.isbn_list=9781424438273&rft_id=info:doi/10.1109/ISCAS.2009.5118285&rft_dat=%3Cieee_6IE%3E5118285%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1424438284&rft.eisbn_list=9781424438280&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5118285&rfr_iscdi=true |