A 9-ns HIT-delay 32-kbyte cache macro for high-speed RISC

A 32-kB cache macro with an experimental reduced instruction set computer (RISC) is realized. A pipelined cache access to realize a cycle time shorter than the cache access time is proposed. A double-word-line architecture combines single-port cells, dual-port cells, and CAM cells into a memory arra...

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Veröffentlicht in:IEEE journal of solid-state circuits 1990-02, Vol.25 (1), p.100-108
Hauptverfasser: Nogami, K., Sakurai, T., Sawada, K., Sakaue, K., Miyazawa, Y., Tanaka, S., Hiruta, Y., Katoh, K., Takayanagi, T., Shirotori, T., Itoh, Y., Uchida, M., Iizuka, T.
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Sprache:eng
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Zusammenfassung:A 32-kB cache macro with an experimental reduced instruction set computer (RISC) is realized. A pipelined cache access to realize a cycle time shorter than the cache access time is proposed. A double-word-line architecture combines single-port cells, dual-port cells, and CAM cells into a memory array to improve silicon area efficiency. The cache macro exhibits 9-ns typical clock-to-HIT delay as a result of several circuit techniques, such as a section word-line selector, a dual transfer gate, and 1.0- mu m CMOS technology. It supports multitask operation with logical addressing by a selective clear circuit. The RISC includes a double-word load/store instruction using a 64-b bus to fully utilize the on-chip cache macro. A test scheme allows measurement of the internal signal delay. The test device design is based on the unified design rules scalable through multigenerations of process technologies down to 0.8 mu m.< >
ISSN:0018-9200
1558-173X
DOI:10.1109/4.50291