Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs
The system soft error rate (SSER) of 4M/16M DRAMs has been shown to be dependent on the cosmic ray neutron flux. A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced s...
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| creator | McKee, W.R. McAdams, H.P. Smith, E.B. McPherson, J.W. Janzen, J.W. Ondrusek, J.C. Hyslop, A.E. Russell, D.E. Coy, R.A. Bergman, D.W. Nguyen, N.Q. Aton, T.J. Block, L.W. Huynh, V.C. |
| description | The system soft error rate (SSER) of 4M/16M DRAMs has been shown to be dependent on the cosmic ray neutron flux. A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced soft errors will become important at the 64M DRAM generation and beyond. |
| doi_str_mv | 10.1109/RELPHY.1996.492052 |
| format | Conference Proceeding |
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A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced soft errors will become important at the 64M DRAM generation and beyond.</description><subject>Aerospace electronics</subject><subject>Aircraft</subject><subject>Cosmic rays</subject><subject>Electrons</subject><subject>Error analysis</subject><subject>Instruments</subject><subject>Mesons</subject><subject>Neutrons</subject><subject>Protons</subject><subject>Silicon</subject><isbn>0780327535</isbn><isbn>9780780327535</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotUF1LAzEQDIig1v6BPu0faM0ll8vlsdRqhYpS-uJTSZONpthLyYfQf2-gXRZmmIFhZwmZNHTWNFQ9bZbrz9XXrFGqm7WKUcFuyAOVPeVMCi7uyDilA63TCsEkvyd_i5CO3kDUZxiw5BgG8IMtBi2UU8KcQNeFoz6ECCYMOfp9yZXnAPkHIQWXAWOsStQZITgwJUYcMujBgiu5RIRvHLDavqY_b-bv6ZHcOv2bcHzFEdm-LLeL1XT98fq2mK-nvpd52ivWOmOd7nFvOa0Ht5KrlhvR1YJMdtXqut71DW_sninZNUobhkZxYXpr-YhMLrEeEXen6I86nneXx_B_xxNbYQ</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>McKee, W.R.</creator><creator>McAdams, H.P.</creator><creator>Smith, E.B.</creator><creator>McPherson, J.W.</creator><creator>Janzen, J.W.</creator><creator>Ondrusek, J.C.</creator><creator>Hyslop, A.E.</creator><creator>Russell, D.E.</creator><creator>Coy, R.A.</creator><creator>Bergman, D.W.</creator><creator>Nguyen, N.Q.</creator><creator>Aton, T.J.</creator><creator>Block, L.W.</creator><creator>Huynh, V.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs</title><author>McKee, W.R. ; McAdams, H.P. ; Smith, E.B. ; McPherson, J.W. ; Janzen, J.W. ; Ondrusek, J.C. ; Hyslop, A.E. ; Russell, D.E. ; Coy, R.A. ; Bergman, D.W. ; Nguyen, N.Q. ; Aton, T.J. ; Block, L.W. ; Huynh, V.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i87t-8924fcdfa8ebd30273473943c56996276dfa668f8131db297619ac2ec935c8dd3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Aerospace electronics</topic><topic>Aircraft</topic><topic>Cosmic rays</topic><topic>Electrons</topic><topic>Error analysis</topic><topic>Instruments</topic><topic>Mesons</topic><topic>Neutrons</topic><topic>Protons</topic><topic>Silicon</topic><toplevel>online_resources</toplevel><creatorcontrib>McKee, W.R.</creatorcontrib><creatorcontrib>McAdams, H.P.</creatorcontrib><creatorcontrib>Smith, E.B.</creatorcontrib><creatorcontrib>McPherson, J.W.</creatorcontrib><creatorcontrib>Janzen, J.W.</creatorcontrib><creatorcontrib>Ondrusek, J.C.</creatorcontrib><creatorcontrib>Hyslop, A.E.</creatorcontrib><creatorcontrib>Russell, D.E.</creatorcontrib><creatorcontrib>Coy, R.A.</creatorcontrib><creatorcontrib>Bergman, D.W.</creatorcontrib><creatorcontrib>Nguyen, N.Q.</creatorcontrib><creatorcontrib>Aton, T.J.</creatorcontrib><creatorcontrib>Block, L.W.</creatorcontrib><creatorcontrib>Huynh, V.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>McKee, W.R.</au><au>McAdams, H.P.</au><au>Smith, E.B.</au><au>McPherson, J.W.</au><au>Janzen, J.W.</au><au>Ondrusek, J.C.</au><au>Hyslop, A.E.</au><au>Russell, D.E.</au><au>Coy, R.A.</au><au>Bergman, D.W.</au><au>Nguyen, N.Q.</au><au>Aton, T.J.</au><au>Block, L.W.</au><au>Huynh, V.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs</atitle><btitle>Proceedings of International Reliability Physics Symposium</btitle><stitle>RELPHY</stitle><date>1996</date><risdate>1996</risdate><spage>1</spage><epage>6</epage><pages>1-6</pages><isbn>0780327535</isbn><isbn>9780780327535</isbn><abstract>The system soft error rate (SSER) of 4M/16M DRAMs has been shown to be dependent on the cosmic ray neutron flux. A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced soft errors will become important at the 64M DRAM generation and beyond.</abstract><pub>IEEE</pub><doi>10.1109/RELPHY.1996.492052</doi><tpages>6</tpages></addata></record> |
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| identifier | ISBN: 0780327535 |
| ispartof | Proceedings of International Reliability Physics Symposium, 1996, p.1-6 |
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| language | eng |
| recordid | cdi_ieee_primary_492052 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Aerospace electronics Aircraft Cosmic rays Electrons Error analysis Instruments Mesons Neutrons Protons Silicon |
| title | Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs |
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