Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

The system soft error rate (SSER) of 4M/16M DRAMs has been shown to be dependent on the cosmic ray neutron flux. A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced s...

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Hauptverfasser: McKee, W.R., McAdams, H.P., Smith, E.B., McPherson, J.W., Janzen, J.W., Ondrusek, J.C., Hyslop, A.E., Russell, D.E., Coy, R.A., Bergman, D.W., Nguyen, N.Q., Aton, T.J., Block, L.W., Huynh, V.C.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Aerospace electronics
Aircraft
Cosmic rays
Electrons
Error analysis
Instruments
Mesons
Neutrons
Protons
Silicon
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Zusammenfassung:The system soft error rate (SSER) of 4M/16M DRAMs has been shown to be dependent on the cosmic ray neutron flux. A simple model and accelerated soft error rate (ASER) measurements made with an intense, high energy neutron beam support this result. The model predicts that cosmic ray neutron induced soft errors will become important at the 64M DRAM generation and beyond.
DOI:10.1109/RELPHY.1996.492052