Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured pr...

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Veröffentlicht in:IEEE Transactions on Nuclear Science 1995-12, Vol.42 (6), p.1964-1974
Hauptverfasser: Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.
Format: Artikel
Sprache:eng
Schlagworte:
ERRORS
EXPERIMENTAL DATA
Hardware
INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS
Instruments
MOS devices
Particle measurements
PHYSICAL RADIATION EFFECTS
Protons
Random access memory
SATELLITES
SEMICONDUCTOR STORAGE DEVICES
Single event upset
SPACE FLIGHT
Space vehicles
Testing
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Beschreibung
Zusammenfassung:This paper presents the results from the CRUX experiment on the Air Force APEX satellite. The experiment monitors single event upsets on screened commercial 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. Pitfalls of using generic ground test data are made clearly evident.
ISSN:0018-9499
1558-1578
DOI:10.1109/23.489241