An Analysis of Temperature Impact on MOSFET Mismatch

Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matching properties with temperature, suggesting a possible physical explanation to this phenomenon and proposing a BSIM3 model implem...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Mennillo, S., Spessot, A., Vendrame, L., Bortesi, L.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analytical models Current measurement Gain measurement Geometry Measurement techniques Monte Carlo methods MOSFET circuits Particle measurements Temperature distribution Testing
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