An Analysis of Temperature Impact on MOSFET Mismatch

An Analysis of Temperature Impact on MOSFET Mismatch

Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matching properties with temperature, suggesting a possible physical explanation to this phenomenon and proposing a BSIM3 model implem...

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Bibliographische Detailangaben
Hauptverfasser: Mennillo, S., Spessot, A., Vendrame, L., Bortesi, L.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analytical models
Current measurement
Gain measurement
Geometry
Measurement techniques
Monte Carlo methods
MOSFET circuits
Particle measurements
Temperature distribution
Testing
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Beschreibung
Zusammenfassung:Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matching properties with temperature, suggesting a possible physical explanation to this phenomenon and proposing a BSIM3 model implementation for Monte Carlo mismatch simulations.
ISSN:1071-9032
2158-1029
DOI:10.1109/ICMTS.2009.4814610