Built-In Self-Test of digital signal processors in Virtex-4 FPGAs

We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operatio...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Pulukuri, M.D., Stroud, C.E.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	adder test Automatic testing Built-in self-test Digital signal processing digital signal processor Digital signal processors Embedded computing Field Programmable Gate Array Field programmable gate arrays Logic arrays Logic programming Logic testing multiplier test Programmable logic arrays Virtex-4
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