Built-In Self-Test of digital signal processors in Virtex-4 FPGAs

Built-In Self-Test of digital signal processors in Virtex-4 FPGAs

We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operatio...

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Hauptverfasser: Pulukuri, M.D., Stroud, C.E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
adder test
Automatic testing
Built-in self-test
Digital signal processing
digital signal processor
Digital signal processors
Embedded computing
Field Programmable Gate Array
Field programmable gate arrays
Logic arrays
Logic programming
Logic testing
multiplier test
Programmable logic arrays
Virtex-4
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Beschreibung
Zusammenfassung:We present a Built-In Self-Test (BIST) approach for testing and diagnosing the embedded digital signal processors (DSPs) in Xilinx Virtex-4 series Field Programmable Gate Arrays (FPGAs). The BIST architecture and configurations needed to test these programmable DSPs in all of their modes of operation are presented along with fault injection and timing analysis of the BIST configurations.
ISSN:0094-2898
2161-8135
DOI:10.1109/SSST.2009.4806783