A study of Cable discharge events and other short time pulses of cabled MR sensors

A study of Cable discharge events and other short time pulses of cabled MR sensors

Sensors used in the storage industry are primarily damaged once a cable has been bonded to the head. This paper focuses on short time pulses, such as, cable discharge events (CDEs) and square wave pulses (SWPs) for MR devices with and without diode protection. Pspice models of CDE events are perform...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Iben, I.E.T.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Capacitance
Circuit testing
Current measurement
Diodes
Electrostatic discharge
Fixtures
Manufacturing
Protection
Pulse measurements
Voltage
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Beschreibung
Zusammenfassung:Sensors used in the storage industry are primarily damaged once a cable has been bonded to the head. This paper focuses on short time pulses, such as, cable discharge events (CDEs) and square wave pulses (SWPs) for MR devices with and without diode protection. Pspice models of CDE events are performed and compared with data. Measurements and Pspice models of short time SW pulses are also done which include the effects of cables and fixture capacitance and inductance.