Constraint satisfaction for test program generation

Constraint satisfaction for test program generation

A central problem in automatic test generation is solving constraints for memory access generation. A framework, and an algorithm that has been implemented in the Model-Based Test-Generator are described. This generic algorithm allows flexibility in modeling new addressing modes with which memory ac...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Lewin, D., Fournier, L., Levinger, M., Roytman, E., Shurek, G.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automatic testing
Computer architecture
Gas insulated transmission lines
Heart
Laboratories
Memory management
Power system modeling
Predictive models
Registers
Software testing
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Beschreibung
Zusammenfassung:A central problem in automatic test generation is solving constraints for memory access generation. A framework, and an algorithm that has been implemented in the Model-Based Test-Generator are described. This generic algorithm allows flexibility in modeling new addressing modes with which memory accesses are generated. The algorithm currently handles address constraint satisfaction for complex addressing modes in the PowerPC, x86, and other architectures.< >
DOI:10.1109/PCCC.1995.472513