Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method

Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method

In this paper, the scan chain diagnosis using the VBUMP Scan Debug method is presented. This diagnosis approach controls the DUT VDD during the scan shifting operation by using ATE VBUMP utility to assist in silicon debug.

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Bibliographische Detailangaben
Hauptverfasser: Khusyari, K., Wei Tee Ng, Jaarsma, N., Abraham, R., Peng Weng Ng, Boon Hui Ang, Chin Hu Ong
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Application specific integrated circuits
Failure analysis
Fault diagnosis
Hardware
Low voltage
Semiconductor device testing
Signal analysis
Silicon
Test pattern generators
Timing
VBUMP
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Beschreibung
Zusammenfassung:In this paper, the scan chain diagnosis using the VBUMP Scan Debug method is presented. This diagnosis approach controls the DUT VDD during the scan shifting operation by using ATE VBUMP utility to assist in silicon debug.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2008.66