Characterization of Nanomagnet Fringing Fields in Hybrid Semiconductor/Ferromagnetic Devices

We describe the fabrication of a hybrid nanomagneto-electronic device, consisting of a GaAs/AlGaAs quantum wire that is bridged by a ferromagnetic gate, and study the influence of the nanomagnet fringing fields on the quantum-wire magneto-resistance. The nonplanar gate shows clear single-domain stru...

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Veröffentlicht in:IEEE transactions on magnetics 2008-12, Vol.44 (12), p.4706-4710
Hauptverfasser: Bae, J.-U., Lin, T.-Y., Yoon, Y., Kim, S.J., Bird, J.P., Imre, A., Porod, W., Reno, J.L.
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Sprache:eng
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Zusammenfassung:We describe the fabrication of a hybrid nanomagneto-electronic device, consisting of a GaAs/AlGaAs quantum wire that is bridged by a ferromagnetic gate, and study the influence of the nanomagnet fringing fields on the quantum-wire magneto-resistance. The nonplanar gate shows clear single-domain structure in magnetic-force microscopy, and a simple magnetization behavior in an external magnetic field. This behavior is reflected as a hysteretic variation of the quantum-wire magneto-resistance, whose magnitude is found to be consistent with theoretical predictions for ballistic electron transport through a spatially varying magnetic field.
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2008.2002924