Feasibility of real-time terahertz speckle metrology

Feasibility of real-time terahertz speckle metrology

A 100-W terahertz free electron laser and a 160times120 microbolometer focal plane array were used to record speckled images of different objects. First- and second-order statistics of the speckle patterns obey classical dependencies. Using a set of speckle photographies, recorded with a repetition...

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Hauptverfasser: Knyazev, B.A., Chaschina, O.I., Cherkassky, V.S., Dem'yanenko, M.A., Esaev, D.G., Kulipanov, G.N., Vinokurov, N.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Arrays
Free electron lasers
Metrology
Photography
Real time systems
Speckle
Surface emitting lasers
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Beschreibung
Zusammenfassung:A 100-W terahertz free electron laser and a 160times120 microbolometer focal plane array were used to record speckled images of different objects. First- and second-order statistics of the speckle patterns obey classical dependencies. Using a set of speckle photographies, recorded with a repetition rate of 41 frames/s, amplitude and logarithmic decrement of damped rotational oscillations of a diffuse reflector were determined.
ISSN:2162-2027
DOI:10.1109/ICIMW.2008.4665840