Measurement of linewidth enhancement factor in 1.3μm quantum dot and quantum well vertical-cavity surface-emitting lasers

This work for the first time, experimentally investigated the linewidth enhancement factor (alpha factor) of quantum dot vertical cavity surface emitting laser. alpha factor values between 0.48 and 0.60 were measured.

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Bibliographische Detailangaben
Hauptverfasser:	Peng, P.C., Yeh, C.E., Kuo, H.C., Yang, S.H., Xuan, R., Lin, G., Chi, J.Y., Wang, S.C.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Gallium arsenide Measurement by laser beam Optical attenuators Quantum dot lasers Semiconductor device measurement Surface emitting lasers Vertical cavity surface emitting lasers
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Beschreibung
Zusammenfassung:	This work for the first time, experimentally investigated the linewidth enhancement factor (alpha factor) of quantum dot vertical cavity surface emitting laser. alpha factor values between 0.48 and 0.60 were measured.
ISSN:	0899-9406 1947-6981
DOI:	10.1109/ISLC.2008.4635996