A new approach for automated characterization of high speed serial interfaces of SoC

A new approach for automated characterization of high speed serial interfaces of SoC

The testing approach described in the paper proposes to reduce the time required for HSSI characterization by testing the devices according to specially developed PHY specifications, instead of direct testing of all electrical parameters required by the supported standards, and introducing an automa...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Fefer, Y., Rysin, A., Mantel, O.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automatic testing
Circuit testing
Distortion
Integrated circuit interconnections
Physical layer
Power system interconnection
Protocols
Standards development
Test equipment
Very large scale integration
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Beschreibung
Zusammenfassung:The testing approach described in the paper proposes to reduce the time required for HSSI characterization by testing the devices according to specially developed PHY specifications, instead of direct testing of all electrical parameters required by the supported standards, and introducing an automated testing setup, based on an automated active probing solution.
DOI:10.1109/COMCAS.2008.4562825