Integrated silicon p-i-n-structures for modulation in terahertz range with highly doped P++, N++ regions

Modulators of terahertz (THz) range on the base of silicon integrated p-i-n-structures are investigated. The generalization of the Fletcher boundary conditions at the injecting electrodes has been put forward for the case of highly doped p ++ , n ++ regions, where both forbidden gap narrowing and de...

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Hauptverfasser: Grimalsky, V., Koshevaya, S., Chillon, D.E., Escobedo, J.A.
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Koshevaya, S.
Chillon, D.E.
Escobedo, J.A.
description Modulators of terahertz (THz) range on the base of silicon integrated p-i-n-structures are investigated. The generalization of the Fletcher boundary conditions at the injecting electrodes has been put forward for the case of highly doped p ++ , n ++ regions, where both forbidden gap narrowing and dependence of coefficients of diffusion on doping are taken into account. The problem of double injection into r-region has been simulated in a two-dimensional case. The investigations of modulation properties of integrated p-i-n-structures in THz range have demonstrated a possibility to use these structures up to the frequencies ap 8 THz.
doi_str_mv 10.1109/ICMEL.2008.4559274
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subjects Boundary conditions
Doping
Electrodes
Equations
Frequency
Microelectronics
Millimeter wave technology
Optical surface waves
Oscillators
Silicon
title Integrated silicon p-i-n-structures for modulation in terahertz range with highly doped P++, N++ regions
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