Supply signal fluctuations due to chip power grid resonance - a new reliability concern

Supply signal fluctuations due to chip power grid resonance - a new reliability concern

On-die measurements of V DD and V SS signals inside a 90 nm technology chip are presented. The results show fluctuations in the V DD and V SS signals, which might constitute an important new reliability concern. These fluctuations also indirectly affect other reliability mechanisms, such as NBTI, HC...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gurfinkel, M., Livshits, P., Rozen, A., Fefer, Y., Bernstein, J.B., Shapira, Y.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
CMOS technology
Fluctuations
Human computer interaction
Logic testing
Niobium compounds
Power grids
Resonance
Semiconductor device measurement
Titanium compounds
Voltage
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:On-die measurements of V DD and V SS signals inside a 90 nm technology chip are presented. The results show fluctuations in the V DD and V SS signals, which might constitute an important new reliability concern. These fluctuations also indirectly affect other reliability mechanisms, such as NBTI, HCI and TDDB. Simulations predict aggravation of this phenomenon for future technologies, which may prove to be a show stopper for further scaling.
ISSN:1541-7026
1938-1891
DOI:10.1109/RELPHY.2008.4559006