Effect of random circuit fabrication errors on small signal gain and phase in traveling wave tubes

Effect of random circuit fabrication errors on small signal gain and phase in traveling wave tubes

Motivated by current interest in sub-mm and THz slow wave vacuum electronic amplifiers, which employ miniature, difficult-to-manufacture slow wave circuits, we evaluate the effects of small random fabrication errors on the small signal characteristics of a TWT.

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Bibliographische Detailangaben
Hauptverfasser: Pengvanich, P., Chernin, D., Yue Ying Lau, Luginsland, J.W., Gilgenbach, R.M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuits
Differential equations
Dispersion
Electron devices
Electron tubes
Fabrication
Manufacturing
Nuclear electronics
Numerical analysis
Signal analysis
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Beschreibung
Zusammenfassung:Motivated by current interest in sub-mm and THz slow wave vacuum electronic amplifiers, which employ miniature, difficult-to-manufacture slow wave circuits, we evaluate the effects of small random fabrication errors on the small signal characteristics of a TWT.
DOI:10.1109/IVELEC.2008.4556409