Gas poisoning of 612-M and 311-XM cathodes
A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10 -8 Torr range. In a series of experiments using quarter-in...
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| creator | Kwan, J. Bieniosek, F. Henestroza, E. Leitner, M. Mitchell, R. Miram, G. Prichard, B. Scarpetti, R. Waldron, W. Westenskow, G. |
| description | A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10 -8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm 2 . |
| doi_str_mv | 10.1109/IVELEC.2008.4556407 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4556407</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4556407</ieee_id><sourcerecordid>4556407</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-228061a043e1aa4dd3bd2f589621071af936ac04d695e47d256651391c2753a83</originalsourceid><addsrcrecordid>eNotj0FLw0AQRhekoK39Bb3sWUic2Z3ZzR4lxFpI6aWItzJmNxrRpHR78d9bsN_lHR48-JRaIZSIEB43r03b1KUBqEpidgT-Rs2RDBF6ZJ6p-cX5AM4R36plzl9wGbE1lu_Uw1qyPk5DnsZh_NBTrx2aYqtljNoiFm9b3cn5c4op36tZL985La9cqP1zs69fina33tRPbTEEOBfGVOBQgGxCEYrRvkfTcxWcQfAofbBOOqDoAify0bBzjDZgZzxbqexCrf6zQ0rpcDwNP3L6PVyv2T97Lj4w</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Gas poisoning of 612-M and 311-XM cathodes</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kwan, J. ; Bieniosek, F. ; Henestroza, E. ; Leitner, M. ; Mitchell, R. ; Miram, G. ; Prichard, B. ; Scarpetti, R. ; Waldron, W. ; Westenskow, G.</creator><creatorcontrib>Kwan, J. ; Bieniosek, F. ; Henestroza, E. ; Leitner, M. ; Mitchell, R. ; Miram, G. ; Prichard, B. ; Scarpetti, R. ; Waldron, W. ; Westenskow, G.</creatorcontrib><description>A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10 -8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm 2 .</description><identifier>ISBN: 1424417155</identifier><identifier>ISBN: 9781424417155</identifier><identifier>DOI: 10.1109/IVELEC.2008.4556407</identifier><identifier>LCCN: 2007906645</identifier><language>eng</language><publisher>IEEE</publisher><subject>Cathodes ; Coatings ; Current density ; DARHT injector ; Degradation ; Electrons ; gas poisoning ; Gases ; M type dispenser cathode ; Optical sensors ; scandium ; Temperature measurement ; Testing ; Voltage</subject><ispartof>2008 IEEE International Vacuum Electronics Conference, 2008, p.44-45</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4556407$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4556407$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kwan, J.</creatorcontrib><creatorcontrib>Bieniosek, F.</creatorcontrib><creatorcontrib>Henestroza, E.</creatorcontrib><creatorcontrib>Leitner, M.</creatorcontrib><creatorcontrib>Mitchell, R.</creatorcontrib><creatorcontrib>Miram, G.</creatorcontrib><creatorcontrib>Prichard, B.</creatorcontrib><creatorcontrib>Scarpetti, R.</creatorcontrib><creatorcontrib>Waldron, W.</creatorcontrib><creatorcontrib>Westenskow, G.</creatorcontrib><title>Gas poisoning of 612-M and 311-XM cathodes</title><title>2008 IEEE International Vacuum Electronics Conference</title><addtitle>IVELEC</addtitle><description>A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10 -8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm 2 .</description><subject>Cathodes</subject><subject>Coatings</subject><subject>Current density</subject><subject>DARHT injector</subject><subject>Degradation</subject><subject>Electrons</subject><subject>gas poisoning</subject><subject>Gases</subject><subject>M type dispenser cathode</subject><subject>Optical sensors</subject><subject>scandium</subject><subject>Temperature measurement</subject><subject>Testing</subject><subject>Voltage</subject><isbn>1424417155</isbn><isbn>9781424417155</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2008</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj0FLw0AQRhekoK39Bb3sWUic2Z3ZzR4lxFpI6aWItzJmNxrRpHR78d9bsN_lHR48-JRaIZSIEB43r03b1KUBqEpidgT-Rs2RDBF6ZJ6p-cX5AM4R36plzl9wGbE1lu_Uw1qyPk5DnsZh_NBTrx2aYqtljNoiFm9b3cn5c4op36tZL985La9cqP1zs69fina33tRPbTEEOBfGVOBQgGxCEYrRvkfTcxWcQfAofbBOOqDoAify0bBzjDZgZzxbqexCrf6zQ0rpcDwNP3L6PVyv2T97Lj4w</recordid><startdate>200805</startdate><enddate>200805</enddate><creator>Kwan, J.</creator><creator>Bieniosek, F.</creator><creator>Henestroza, E.</creator><creator>Leitner, M.</creator><creator>Mitchell, R.</creator><creator>Miram, G.</creator><creator>Prichard, B.</creator><creator>Scarpetti, R.</creator><creator>Waldron, W.</creator><creator>Westenskow, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200805</creationdate><title>Gas poisoning of 612-M and 311-XM cathodes</title><author>Kwan, J. ; Bieniosek, F. ; Henestroza, E. ; Leitner, M. ; Mitchell, R. ; Miram, G. ; Prichard, B. ; Scarpetti, R. ; Waldron, W. ; Westenskow, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-228061a043e1aa4dd3bd2f589621071af936ac04d695e47d256651391c2753a83</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Cathodes</topic><topic>Coatings</topic><topic>Current density</topic><topic>DARHT injector</topic><topic>Degradation</topic><topic>Electrons</topic><topic>gas poisoning</topic><topic>Gases</topic><topic>M type dispenser cathode</topic><topic>Optical sensors</topic><topic>scandium</topic><topic>Temperature measurement</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Kwan, J.</creatorcontrib><creatorcontrib>Bieniosek, F.</creatorcontrib><creatorcontrib>Henestroza, E.</creatorcontrib><creatorcontrib>Leitner, M.</creatorcontrib><creatorcontrib>Mitchell, R.</creatorcontrib><creatorcontrib>Miram, G.</creatorcontrib><creatorcontrib>Prichard, B.</creatorcontrib><creatorcontrib>Scarpetti, R.</creatorcontrib><creatorcontrib>Waldron, W.</creatorcontrib><creatorcontrib>Westenskow, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kwan, J.</au><au>Bieniosek, F.</au><au>Henestroza, E.</au><au>Leitner, M.</au><au>Mitchell, R.</au><au>Miram, G.</au><au>Prichard, B.</au><au>Scarpetti, R.</au><au>Waldron, W.</au><au>Westenskow, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Gas poisoning of 612-M and 311-XM cathodes</atitle><btitle>2008 IEEE International Vacuum Electronics Conference</btitle><stitle>IVELEC</stitle><date>2008-05</date><risdate>2008</risdate><spage>44</spage><epage>45</epage><pages>44-45</pages><isbn>1424417155</isbn><isbn>9781424417155</isbn><abstract>A 2 kA cathode was successfully developed for the DARHT-II injector [1]. Since the DARHT injector cannot be baked and there may be virtual leaks, the local pressure near the cathode was not ideal even though the system pressure was in the 10 -8 Torr range. In a series of experiments using quarter-inch size button cathodes, we showed that gas poisoning was a significant factor in this pressure range. Furthermore we found that the 311-XM (doped with scandium and has an M coating) cathode was less affected by gas poisoning than the 612-M, corresponding to a lower effective work function. Water vapor was found to be the worst contaminant among the various gases that we have tested. With a 6.5rdquo diameter 311-XM cathode, the DARHT-II injector produced > 2 kA corresponding to a current density of 10 A/cm 2 .</abstract><pub>IEEE</pub><doi>10.1109/IVELEC.2008.4556407</doi><tpages>2</tpages></addata></record> |
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| subjects | Cathodes Coatings Current density DARHT injector Degradation Electrons gas poisoning Gases M type dispenser cathode Optical sensors scandium Temperature measurement Testing Voltage |
| title | Gas poisoning of 612-M and 311-XM cathodes |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T14%3A04%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Gas%20poisoning%20of%20612-M%20and%20311-XM%20cathodes&rft.btitle=2008%20IEEE%20International%20Vacuum%20Electronics%20Conference&rft.au=Kwan,%20J.&rft.date=2008-05&rft.spage=44&rft.epage=45&rft.pages=44-45&rft.isbn=1424417155&rft.isbn_list=9781424417155&rft_id=info:doi/10.1109/IVELEC.2008.4556407&rft_dat=%3Cieee_6IE%3E4556407%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4556407&rfr_iscdi=true |