Fabrication of silicon carriers with TSV electrical interconnections and embedded thermal solutions for high power 3-D package

This paper presents micro fabrication process and wafer level integration of a silicon carrier, in which optimized liquid cooling layers are embedded. Two or more carriers can then be stacked together with a silicon interposer in between to make up of a stacked cooling module for high power heat dis...

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Hauptverfasser: Aibin Yu, Khan, N., Archit, G., Pinjala, D., Kok Chuan Toh, Kripesh, V., Seung Wook Yoon, Lau, J.H.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:This paper presents micro fabrication process and wafer level integration of a silicon carrier, in which optimized liquid cooling layers are embedded. Two or more carriers can then be stacked together with a silicon interposer in between to make up of a stacked cooling module for high power heat dissipation. Wafer bonding are carried out with AuSn-solder which deposited by evaporation and the shear strength is higher than 27.2 MPa after bonding, which is high enough for application. The advantage of this 3-D stacking method is that it provides a method of simultaneous realizing electrical interconnection and fluidic path between two carriers and it can extract heat from the constraints of 3-D silicon module chips to surface without external liquid circulation.
ISSN:0569-5503
2377-5726
DOI:10.1109/ECTC.2008.4549945