Defect-Oriented Testing of RF Circuits

Radio-frequency (RF) test cost is soaring due to the increasing complexity of RF devices. Radically new test approaches that enable test time reduction while ensuring product quality are needed to reduce the overall product cost. In this paper, we present a test development methodology for RF circui...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2008-05, Vol.27 (5), p.920-931
Hauptverfasser:	Acar, E., Ozev, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit faults Circuit simulation Circuit testing Circuits Cost engineering Costs Defects Devices Failure analysis Fault-based testing Handheld computers Hardware Manufacturing Mathematical models Methodology Radio frequencies Radio frequency Radiofrequency identification RF domain fault models RF testing Studies test cost reduction Test times
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