Optimal High-Resolution Spectral Analyzer

This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for the signal analysis is the fast Fourier transform (FFT algorithms). Such complex algorithms are not suitable for BIST (buil...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tchegho, A., Mattes, H., Sattler, S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Built-in self-test Circuit testing Fast Fourier transforms Field programmable gate arrays Production Radio frequency Signal analysis Signal generators Software testing Spectral analysis
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