Optimal High-Resolution Spectral Analyzer

This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for the signal analysis is the fast Fourier transform (FFT algorithms). Such complex algorithms are not suitable for BIST (built-in self-test) or BOST (built-off self-test) solutions due to their high demand for resources. In this paper, the Goertzel algorithm will be presented as an alternative to FFT algorithms. A new optimized structure of the Goertzel algorithm and its implementation in an FPGA (field programmable gate array) is presented. A comparison within the scope of the production test of RF transceiver devices shows a considerable reduction of the test time (factor 6) and resources (factor 10) compared to a FFT software solution respectively hardware solution.