Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions...

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Veröffentlicht in:	IEEE transactions on electromagnetic compatibility 2008-02, Vol.50 (1), p.22-34
Hauptverfasser:	Labussiere-Dorgan, C., Bendhia, S., Sicard, E., Junwu Tao, Quaresma, H.J., Lochot, C., Vrignon, B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Conducted emission Design. Technologies. Operation analysis. Testing Electrical engineering. Electrical power engineering Electrical machines Electromagnetic compatibility electromagnetic compatibility (EMC) Electromagnetism Electronics Emission Engineering Sciences Exact sciences and technology Information, signal and communications theory integrated circuit (IC) integrated circuit emission model (ICEM) Integrated circuit modeling Integrated circuits Integrated circuits by function (including memories and processors) Mathematical models measurement standards Methodology microcontroller Microcontrollers Pins Predictive models radiated emission Regulation and control Semiconductor device measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Telecommunications and information theory
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Beschreibung
Zusammenfassung:	This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions of a commercial 16-bit microcontroller. The emission measurements are performed according to several EM compatibility standards, namely, 1 Omega /150 Omega , surface scan, and transverse EM/gigahertz transverse EM (GTEM) method, and their results show an excellent fit with model predictions.
ISSN:	0018-9375 1558-187X
DOI:	10.1109/TEMC.2007.911918