Finding power/ground defects on connectors - a new approach

Finding power/ground defects on connectors - a new approach

Printed circuit boards are steadily becoming faster, and as a result, relatively ordinary defects in connectors and sockets can now have more subtle and damaging effects. At the same time these defects defy detection by conventional technologies. This paper surveys existing tests for these defects a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Parker, K.P., Hird, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Clocks
Connectors
Degradation
Electromagnetic interference
Electronic equipment testing
Keyways
Pins
Printed circuits
Signal design
Sockets
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Printed circuit boards are steadily becoming faster, and as a result, relatively ordinary defects in connectors and sockets can now have more subtle and damaging effects. At the same time these defects defy detection by conventional technologies. This paper surveys existing tests for these defects and introduces a new solution based on network parameter measurements.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2007.4437624