Analysis of the electrical characteristics of LDMOSFET under various temperature

In this paper, we have investigated the electrical characteristics of power LDMOSFETs having different gate lengths(2.1 mum -3 mum) in the temperature range of 100 K-500 K. The specific on-resistance and the off-state breakdown voltage increase with temperature. The result shows that the specific on...

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Hauptverfasser: Jeong-Man Son, Seung-Bum Yuk, Jae-Hyun Lee, Jae-Chang Kwak, Jong-Ki Kwon, Yong-Seo Koo
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:In this paper, we have investigated the electrical characteristics of power LDMOSFETs having different gate lengths(2.1 mum -3 mum) in the temperature range of 100 K-500 K. The specific on-resistance and the off-state breakdown voltage increase with temperature. The result shows that the specific on- resistance increases exponentially with the exponent of 2.2 and, by contrast, the off-state breakdown voltage increases linearly with a slope of 100 mV/K (Drift region concentration of measured device: 2 times 10 15 cm -3 ). As a result, Ron/BV, known for a figure of merit of power device, increases with temperature.
ISSN:2159-3442
2159-3450
DOI:10.1109/TENCON.2007.4428972