A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements
A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment tha...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2008-02, Vol.57 (2), p.261-267 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Giannini, F. Bourdel, E. Pasquet, D. |
| description | A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment than the classic noise parameter measurement method. It gives direct results for 801 points in the 2.8-18-GHz frequency band. |
| doi_str_mv | 10.1109/TIM.2007.909491 |
| format | Article |
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It gives direct results for 801 points in the 2.8-18-GHz frequency band.</description><subject>Admittance</subject><subject>Frequency bands</subject><subject>Frequency measurement</subject><subject>High-frequency noise</subject><subject>Impedance</subject><subject>Instrumentation</subject><subject>Measurement methods</subject><subject>Noise</subject><subject>Noise figure</subject><subject>Noise measurement</subject><subject>noise parameters</subject><subject>Power measurement</subject><subject>Power measurements</subject><subject>Spectra</subject><subject>Spectral analysis</subject><subject>Switches</subject><subject>Temporal logic</subject><subject>Testing</subject><subject>time domain</subject><subject>Time domain analysis</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkbtPwzAQhy0EEuUxM7BYLExpz7HjxGMpr0q8hjJHF-cigpq42KlK_3uMCgzohlu-3z30MXYmYCwEmMli_jhOAfKxAaOM2GMjkWV5YrRO99kIQBSJUZk-ZEchvEMEtcpHLEz5E234Iw1vruaD4zefg0c78CfXBuIv6LGjgXzgVxio5q7nyG89faypt9uEY1_zRdtRcu06bHs-7XG5DW3grvkd4Tbk4wIMa08d9UM4YQcNLgOd_vRj9np7s5jdJw_Pd_PZ9CGxMoUhqVOlMmkwsyhri02tsyYXFjJbQGErndZFVSkFpimMrBCpoUYTKtCi0rXI5TG73M1deRfvDUPZtcHScok9uXUoizwDKSFXkbz4R767tY-vREinCmLpCE12kPUuBE9NufJth35bCii_FZRRQfmtoNwpiInzXaIloj9aqTSXhZRfeuSCIA</recordid><startdate>20080201</startdate><enddate>20080201</enddate><creator>Giannini, F.</creator><creator>Bourdel, E.</creator><creator>Pasquet, D.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| ispartof | IEEE transactions on instrumentation and measurement, 2008-02, Vol.57 (2), p.261-267 |
| issn | 0018-9456 1557-9662 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Admittance Frequency bands Frequency measurement High-frequency noise Impedance Instrumentation Measurement methods Noise Noise figure Noise measurement noise parameters Power measurement Power measurements Spectra Spectral analysis Switches Temporal logic Testing time domain Time domain analysis |
| title | A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements |
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