A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements

A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements

A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment tha...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2008-02, Vol.57 (2), p.261-267
Hauptverfasser: Giannini, F., Bourdel, E., Pasquet, D.
Format: Artikel
Sprache:eng
Schlagworte:
Admittance
Frequency bands
Frequency measurement
High-frequency noise
Impedance
Instrumentation
Measurement methods
Noise
Noise figure
Noise measurement
noise parameters
Power measurement
Power measurements
Spectra
Spectral analysis
Switches
Temporal logic
Testing
time domain
Time domain analysis
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Beschreibung
Zusammenfassung:A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment than the classic noise parameter measurement method. It gives direct results for 801 points in the 2.8-18-GHz frequency band.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2007.909491