Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide som...

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Bibliographische Detailangaben
Hauptverfasser: Robson, N., Safran, J., Kothandaraman, C., Cestero, A., Xiang Chen, Rajeevakumar, R., Leslie, A., Moy, D., Kirihata, T., Iyer, S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Cathodes
Circuits
Electromigration
Fuses
Laser theory
MOS devices
Nonvolatile memory
System testing
Very large scale integration
Wiring
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Beschreibung
Zusammenfassung:Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.
ISSN:0886-5930
2152-3630
DOI:10.1109/CICC.2007.4405850