Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC

Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC

In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Liquan Fang, Yang Zhong, van de Donk, H., Yizi Xing
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Automatic testing
Circuit faults
Circuit testing
Current measurement
Integrated circuit testing
Power supplies
Production
Semiconductor device testing
System testing
US Department of Transportation
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Beschreibung
Zusammenfassung:In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage improvements have been selected and implemented in the production testing flow.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2007.93