High-frequency characterization and simulation of conductor loss in printable electronics technology

The conductor loss of very thin lossy printed silver nanoparticle traces manufactured using the printable electronics technology is characterized up to 10 GHz by simulations and measurements. Microstrip resonators are used as test structures.

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Bibliographische Detailangaben
Hauptverfasser: Pynttari, V., Makinen, R., Lilja, J., Pekkanen, V., Mantysalo, M., Mansikkamaki, P., Kivikoski, M.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:The conductor loss of very thin lossy printed silver nanoparticle traces manufactured using the printable electronics technology is characterized up to 10 GHz by simulations and measurements. Microstrip resonators are used as test structures.
ISSN:2165-4107
DOI:10.1109/EPEP.2007.4387165