The Charged Particles' Behaviour in Crossed-Field Devices

The Charged Particles' Behaviour in Crossed-Field Devices

The crossed-field devices have higher noise level comparing O-type devices. This noise level can excite due to chaotic behaviour of the charged particles in crossed-field systems. Here we have discussed the charged particles' motion in magnetron with smooth and cavity anode and such motion stab...

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Hauptverfasser: Gryshchenko, T.B., Nikitenko, O.M., Vlashchenko, L.G., Volovenko, M.V.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Anodes
Azimuth
Cavity resonators
Chaos
Electrodes
Electrons
Electrostatics
Laplace equations
Noise level
Stability
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creator Gryshchenko, T.B.
Nikitenko, O.M.
Vlashchenko, L.G.
Volovenko, M.V.
description The crossed-field devices have higher noise level comparing O-type devices. This noise level can excite due to chaotic behaviour of the charged particles in crossed-field systems. Here we have discussed the charged particles' motion in magnetron with smooth and cavity anode and such motion stability.
doi_str_mv 10.1109/MIKON.2006.4345322
format Conference Proceeding
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identifier ISBN: 9788390666273
ispartof 2006 International Conference on Microwaves, Radar & Wireless Communications, 2006, p.873-876
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Anodes
Azimuth
Cavity resonators
Chaos
Electrodes
Electrons
Electrostatics
Laplace equations
Noise level
Stability
title The Charged Particles' Behaviour in Crossed-Field Devices
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