The Charged Particles' Behaviour in Crossed-Field Devices

The Charged Particles' Behaviour in Crossed-Field Devices

The crossed-field devices have higher noise level comparing O-type devices. This noise level can excite due to chaotic behaviour of the charged particles in crossed-field systems. Here we have discussed the charged particles' motion in magnetron with smooth and cavity anode and such motion stab...

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Bibliographische Detailangaben
Hauptverfasser: Gryshchenko, T.B., Nikitenko, O.M., Vlashchenko, L.G., Volovenko, M.V.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Anodes
Azimuth
Cavity resonators
Chaos
Electrodes
Electrons
Electrostatics
Laplace equations
Noise level
Stability
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Beschreibung
Zusammenfassung:The crossed-field devices have higher noise level comparing O-type devices. This noise level can excite due to chaotic behaviour of the charged particles in crossed-field systems. Here we have discussed the charged particles' motion in magnetron with smooth and cavity anode and such motion stability.
DOI:10.1109/MIKON.2006.4345322