Compendia of Radiation Test Results

Compendia of Radiation Test Results

TID and SEE data were taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Layton, P., Longden, L., Patnaude, E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Annealing
Digital-analog conversion
Integrated circuit testing
Packaging
Performance analysis
Performance evaluation
Production
Software performance
Software testing
Temperature
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Beschreibung
Zusammenfassung:TID and SEE data were taken to qualify and evaluate IC devices for radiation susceptibility in the natural space environment. A summary of the test data is presented and discussed.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2007.4342554