X-Ray Photoemission Calculations
Results are presented from an extensive parametric study of x-ray photoemission. Calculations were performed of fore and back emission yield and energy-angular distribution, including the two-dimensional, asymmetric angular distribution for non-normal photon incidence, for a broad range of photon en...
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| Veröffentlicht in: | IEEE transactions on nuclear science 1975-01, Vol.22 (6), p.2345-2350 |
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| container_end_page | 2350 |
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| container_issue | 6 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 22 |
| creator | Chadsey, William L. Wilson, C. Woodrow Pine, Vernon W. |
| description | Results are presented from an extensive parametric study of x-ray photoemission. Calculations were performed of fore and back emission yield and energy-angular distribution, including the two-dimensional, asymmetric angular distribution for non-normal photon incidence, for a broad range of photon energies, angles of incidence, and material atomic numbers. Monte Carlo and analytical calculations are compared with one another and with experimental data. A new Monte Carlo method is presented which makes feasible the calculation of the two-dimensional angular distribution and yields a continuous representation of the distribution in functional form. |
| doi_str_mv | 10.1109/TNS.1975.4328131 |
| format | Article |
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A new Monte Carlo method is presented which makes feasible the calculation of the two-dimensional angular distribution and yields a continuous representation of the distribution in functional form.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.1975.4328131</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>IEEE</publisher><subject>Analytical models ; Distributed computing ; Electrons ; Materials testing ; Monte Carlo methods ; Optical computing ; Parametric study ; Photoelectricity ; Radiation effects ; Transmission line matrix methods</subject><ispartof>IEEE transactions on nuclear science, 1975-01, Vol.22 (6), p.2345-2350</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c294t-1e21beb12b4f367af28cfe991961479df87e5618522c86d9c0bd480c27bb1ab3</citedby><cites>FETCH-LOGICAL-c294t-1e21beb12b4f367af28cfe991961479df87e5618522c86d9c0bd480c27bb1ab3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4328131$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4328131$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chadsey, William L.</creatorcontrib><creatorcontrib>Wilson, C. Woodrow</creatorcontrib><creatorcontrib>Pine, Vernon W.</creatorcontrib><title>X-Ray Photoemission Calculations</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Results are presented from an extensive parametric study of x-ray photoemission. Calculations were performed of fore and back emission yield and energy-angular distribution, including the two-dimensional, asymmetric angular distribution for non-normal photon incidence, for a broad range of photon energies, angles of incidence, and material atomic numbers. Monte Carlo and analytical calculations are compared with one another and with experimental data. A new Monte Carlo method is presented which makes feasible the calculation of the two-dimensional angular distribution and yields a continuous representation of the distribution in functional form.</description><subject>Analytical models</subject><subject>Distributed computing</subject><subject>Electrons</subject><subject>Materials testing</subject><subject>Monte Carlo methods</subject><subject>Optical computing</subject><subject>Parametric study</subject><subject>Photoelectricity</subject><subject>Radiation effects</subject><subject>Transmission line matrix methods</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1975</creationdate><recordtype>article</recordtype><recordid>eNo9kDFPwzAQRi0EEqGwI7FkYnPxOXZsjyiCglQBggxslu1cRFDalDgZ-u9JlcJ0d7r3nU6PkGtgSwBm7sqXjyUYJZci4xoyOCEJSKkpSKVPScIYaGqEMefkIsbvaRSSyYSkn_Td7dO3r27ocNPE2HTbtHBtGFs3TH28JGe1ayNeHeuClI8PZfFE16-r5-J-TQM3YqCAHDx64F7UWa5czXWo0RgwOQhlqlorlDloyXnQeWUC85XQLHDlPTifLcjtfHbXdz8jxsFOzwRsW7fFboyWc8khU2wC2QyGvouxx9ru-mbj-r0FZg8m7GTCHkzYo4kpcjNHGkT8x_-2v8P9WKI</recordid><startdate>19750101</startdate><enddate>19750101</enddate><creator>Chadsey, William L.</creator><creator>Wilson, C. 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Woodrow ; Pine, Vernon W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c294t-1e21beb12b4f367af28cfe991961479df87e5618522c86d9c0bd480c27bb1ab3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1975</creationdate><topic>Analytical models</topic><topic>Distributed computing</topic><topic>Electrons</topic><topic>Materials testing</topic><topic>Monte Carlo methods</topic><topic>Optical computing</topic><topic>Parametric study</topic><topic>Photoelectricity</topic><topic>Radiation effects</topic><topic>Transmission line matrix methods</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chadsey, William L.</creatorcontrib><creatorcontrib>Wilson, C. 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Woodrow</au><au>Pine, Vernon W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-Ray Photoemission Calculations</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>1975-01-01</date><risdate>1975</risdate><volume>22</volume><issue>6</issue><spage>2345</spage><epage>2350</epage><pages>2345-2350</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Results are presented from an extensive parametric study of x-ray photoemission. Calculations were performed of fore and back emission yield and energy-angular distribution, including the two-dimensional, asymmetric angular distribution for non-normal photon incidence, for a broad range of photon energies, angles of incidence, and material atomic numbers. Monte Carlo and analytical calculations are compared with one another and with experimental data. A new Monte Carlo method is presented which makes feasible the calculation of the two-dimensional angular distribution and yields a continuous representation of the distribution in functional form.</abstract><pub>IEEE</pub><doi>10.1109/TNS.1975.4328131</doi><tpages>6</tpages></addata></record> |
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| ispartof | IEEE transactions on nuclear science, 1975-01, Vol.22 (6), p.2345-2350 |
| issn | 0018-9499 1558-1578 |
| language | eng |
| recordid | cdi_ieee_primary_4328131 |
| source | IEEE Electronic Library (IEL) |
| subjects | Analytical models Distributed computing Electrons Materials testing Monte Carlo methods Optical computing Parametric study Photoelectricity Radiation effects Transmission line matrix methods |
| title | X-Ray Photoemission Calculations |
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